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Abstract
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Low field response function calculations have
been performed on a two-dimensional electron gas with
well-defined electron-surface roughness scattering. The
Lindhard model was employed to compute the response
function. In particular, detailed investigations were made
on the system searching for an interplay between surface
roughness with well-defined correlation function, (characterizes
by asperity height and correlation length) spatial
confinement and the dielectric function. We analyze to
what extent the normal behavior and functionality of
dielectric function of two-dimensional devices are modified
by random scattering events caused by the contribution
from the surface roughness. Results of the current work
indicate that contribution of the surface roughness on
scattering and absorption process could not be considered
as an underestimating effect. We find, however, that
functionality of the dielectric function seems to be quite
independent of the particular roughness features.
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