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Abstract
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In this paper, the temperature dependence of the defect mode and optical bistability (OB) in a one-dimensional semiconductor photonic crystal heterostructure (1DSPCH) with a semiconductor defect layer were theoretically investigated in 5.8 µm-7.8 µm wavelength region. A symmetric arrangement of (Si/air)mSi(air/Si)m, where Si is semiconductor silicon layer, m is the periodicity and air stands for air gap layer, was considered in this communication. The refractive index of Si layersare taken to be dependent on temperature and wavelength, simultaneously. By employing the linear and nonlinear transfer matrix methods, the linear transmittance spectrum and the nonlinear transmission curves were graphically illustrated for different temperatures. A temperature-dependent defect mode was observed in linear transmittance spectrum. The average change in the central wavelength of the defect mode is 50 nm/(100 K) in the range of temperature variation from 3000K to 7000K. Correspondingly, the switch-up thresholds are 160GW/(cm2 0K) and 78 GW/(cm2 0K), respectively. Dynamically shifting the defect mode, due to temperature-dependence of Si layers refractive index, is the physical response of the effects. The knowledge of thermal properties of PC structure could be of technical use for designing the thermal sensor or switch in the optical integrated devices.
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